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GOLDSTAR Instruments Brings you the next generation in portable precious metals analysis with the GOLDSTAR XRF analyzer. The GOLDSTAR is an easy to use, cost effective method that provides fast alloy analysis and Karat classification with one non-destructive test.
The GOLDSTAR SI-PIN ® is latest Innovation in field of XRF it is equipped with latest detector technology with very less noise & better count rate as compare with Prop Counter detector.
They are well suited for the non-destructive coating thickness measurement and material analysis to trace even very small amount of metal presence because of very high count rate.
The GOLDSTAR SI-PIN ® Instruments are especially well suited for measuring Analyzing thin coatings, even with very complex compositions or small concentrations can be possible with high accuracy rate because of better resolution ≤145 eV than those Prop Counter technologies.
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