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Product Code : SiPin XGM-500

Price And Quantity

Minimum Order Quantity
1 Piece/Pieces
Price
1800000 INR

Product Description

GOLDSTAR Instruments Brings you the next generation in portable precious metals analysis with the GOLDSTAR XRF analyzer. The GOLDSTAR is an easy to use, cost effective method that provides fast alloy analysis and Karat classification with one non-destructive test.

Description

The GOLDSTAR SI-PIN ® is latest Innovation in field of XRF it is equipped with latest detector technology with very less noise & better count rate as compare with Prop Counter detector.

They are well suited for the non-destructive coating thickness measurement and material analysis to trace even very small amount of metal presence because of very high count rate.

The GOLDSTAR SI-PIN ® Instruments are especially well suited for measuring Analyzing thin coatings, even with very complex compositions or small concentrations can be possible with high accuracy rate because of better resolution ≤145 eV than those Prop Counter technologies.

Typical fields of Application:

Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries ¾ Research in universities and in the industries.

Advance Features :

Technological alternative to fire assay for elemental analysis
On the spot certification of Karat content, (0-24 KARAT)
Identification impurities & Powder like Ir, Ru, Rh, Ni, Pb, Fe, Co, Sn, Os , In And other Elements
Analysis of platinum, gold, silver and other precious alloys
Silver Analysis is also possible ¾ Verification of gold content in scrap gold
Outstanding accuracy and long term stability are characteristics of all GOLDSTAR Instruments
X-RAY systems the necessity of recalibration is dramatically reduced, saving time and effort For high accuracy tasks calibrations can be performed at any time
The fundamental parameter method by GOLDSTAR allows for the analysis of solid and liquid specimens as well as coating systems without calibration

Design :

The GOLDSTAR SI-PIN ® Models are designed as user-friendly bench-top Instruments
Fixed sample support & manually operable XY stage for accurate positioning of small parts and larger measuring chamber Optional
For quick and easy sample positioning, the X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window
The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment
The entire operation and evaluation of measurements as well as the clear Presentation of measurement data is performed on a PC, using the Powerful and user-friendly software

Technical Specifications :